Loading...
Recherche
![Chargement de la page](/img/loading.gif)
Derniers dépôts
![Chargement de la page](/img/loading.gif)
Dépôts en texte intégral
93
Mots clés
Alloy
Alloys
Pb centers
NRP
Thin films
Nuclear resonance profiling NRP
Topological insulators
Ageing
17Opp
Pulsed laser deposition
Rutherford backscattering spectrometry RBS
Sputtering
ALD
GaMnAs
Capillary condensation
AC susceptibility
Aluminium
Ion beam analysis
Annealing
6855Jk
Growth
Topological defects
Nickel
Silica
Adsorbed layers
Magnetization curves
SiC
Aluminum
Density functional theory
Epitaxial growth
3C-SiC
Stable isotopic tracing
Nanostructures
Energy loss
EPR
18O resonance
Kossel diffraction
Hysteresis
Charge exchange
Interface defects
HfO2
AFM
Acoustic
13C
Photoluminescence
X-ray diffraction
Magnetic semiconductors
Nitridation
Nuclear reaction analysis
Passivation
7630Lh
XRD
Measurement
7550Ee
Oxygen deficiency
Epitaxy
Low energy electron diffraction LEED
ADSORPTION DESORPTION HYSTERESIS
Metal-insulator transition
Oxidation
27Ald p&α
RBS
27Aldp
Evaluation
Nanoparticles
Defects
PIXE
Adsorption Isotherms
8140Ef
Silicon
Al2O3
Periodic multilayer
Zinc oxide
Magnetic anisotropy
17Op
Indium oxide
Gold
Multilayer
Channeling
27Alda
Thin film
Raman spectroscopy
Transparent conductive oxide TCO
Silicon carbide
Isotopic Tracing
Adsorption
Auger electron spectroscopy AES
Ferromagnetic resonance
Diffusion
Ion implantation
XPS
Atomic Layer Deposition ALD
18O
Gallium oxide
2H
17O
15N
Silicon Carbide
7550Pp
Acoustic propreties of solid