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Keywords
Multilayer
Aluminum
AFM
Acoustic propreties of solid
NRP
Topological defects
Silicon Carbide
Auger electron spectroscopy AES
15N
Alloys
Thin film
Growth
Ageing
Sputtering
Indium oxide
13C
Raman spectroscopy
GaMnAs
ADSORPTION DESORPTION HYSTERESIS
27Aldp
SiC
Nickel
Nitridation
Metal-insulator transition
Epitaxy
Magnetic anisotropy
Rutherford backscattering spectrometry RBS
Zinc oxide
Nanoparticles
Topological insulators
27Alda
Thin films
Evaluation
7550Pp
Capillary condensation
Magnetic semiconductors
27Ald p&α
Alloy
Ferromagnetic resonance
Hysteresis
17O
3C-SiC
RBS
Adsorption Isotherms
Atomic Layer Deposition ALD
7630Lh
Measurement
EPR
Acoustic
17Opp
Density functional theory
Interface defects
Adsorbed layers
ALD
Diffusion
Kossel diffraction
XRD
Transparent conductive oxide TCO
Nuclear resonance profiling NRP
Silicon carbide
X-ray diffraction
2H
PIXE
Gallium oxide
18O
Pb centers
Ion implantation
6855Jk
Al2O3
Channeling
18O resonance
Gold
Ion beam analysis
Passivation
Defects
Epitaxial growth
Pulsed laser deposition
7550Ee
Oxygen deficiency
Adsorption
Stable isotopic tracing
Aluminium
AC susceptibility
Silicon
Annealing
Photoluminescence
Charge exchange
Nuclear reaction analysis
Isotopic Tracing
17Op
Magnetization curves
Periodic multilayer
HfO2
Low energy electron diffraction LEED
Energy loss
Nanostructures
XPS
Silica
8140Ef
Oxidation