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Journal Articles Applied Physics Letters Year : 2017

"Noiseless" thermal noise measurement of atomic force microscopy cantilevers

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1
Basile Pottier
Ludovic Bellon

Abstract

When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing method that allows to get rid of this limitation using the ubiquitous optical beam deflection sensor of standard AFMs. We demonstrate a two orders of magnitude enhancement of the signal to noise ratio in our experiment, allowing the calibration of stiff cantilevers or easy identification of higher order modes from thermal noise measurements.
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Dates and versions

hal-01485079 , version 1 (08-03-2017)

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Basile Pottier, Ludovic Bellon. "Noiseless" thermal noise measurement of atomic force microscopy cantilevers. Applied Physics Letters, 2017, 110, pp.094105. ⟨10.1063/1.4977790⟩. ⟨hal-01485079⟩
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